PINKY KUMARI; CHEEKIRI VENKATA MURALI KRISHNA; BALIJABUDDA CHARAN. A Forensic Approach to Image Clone Detection Using Structural Similarity Index (SSIM) and Error Level Analysis (ELA). International Journal of Innovations in Science, Engineering And Management, [S. l.], v. 5, n. 3, p. 72–83, 2026. DOI: 10.69968/ijisem.2026v5i372-83. Disponível em: https://ijisem.com/journal/index.php/ijisem/article/view/623. Acesso em: 18 jul. 2026.