Design and Implementation of a Low-Cost, High-Density IIoT Gateway for Smart Factory Monitoring Using ESP32

Authors

  • Devya Department of Automation and Robotics Engineering, Prestige Institute of Engineering Management and Research, Indore, India divyaaprajapati04@gmail.com
  • Shib Sankar Das Department of Computer Science and Engineering, Techno Bengal Institute of Technology, Kolkata , India shibsankardas721@gmail.com

DOI:

https://doi.org/10.69968/ijisem.2026v5i2364-375

Keywords:

Industry 4.0, IIoT Gateway, ESP32, Embedded Firmware, High-Density Monitoring, Resource-Constrained Microcontrollers, Chunked Transfer Encoding, Network Resilience, Data Persistence, Smart Factory

Abstract

Affordable real-time machine monitoring remains an unsolved operational challenge for small and medium-scale enterprises (MSMEs), where the capital cost of Programmable Logic Controllers (PLCs) and proprietary industrial gateways renders factory-floor visibility economically inaccessible. This paper presents a low-cost IIoT edge gateway engineered on the ESP32 microcontroller, delivering production-grade machine monitoring without the financial burden of conventional infrastructure.

The central contribution is a firmware architecture that scales a single ESP32 — equipped with only 320 KB of Static RAM (SRAM) — to simultaneously monitor and control 512 independent machine nodes (M1–M512) through a live web dashboard. This was achieved through an optimized memory-mapping strategy combined with a purpose-built Chunked Transfer Encoding mechanism over a native HTTP server, which streams dashboard payloads in bounded segments rather than constructing full responses in memory, preventing heap exhaustion under high-density node loads.

Operational continuity in electromagnetically harsh factory environments is maintained by a "Hybrid Scan & Auto-Connect" firmware routine that periodically evaluates Received Signal Strength Indication (RSSI) across a prioritized list of saved network credentials and autonomously switches to the strongest available connection, eliminating monitoring gaps caused by localized interference or access-point failures. Machine states and user-defined node labels are committed to persistent flash storage via the ESP32's Non-Volatile Storage (NVS) Preferences library, ensuring complete context restoration following abrupt power interruptions.

The proposed system demonstrates that resource-constrained microcontrollers, when paired with thoughtfully optimized firmware strategies, are fully capable of sustaining the monitoring demands of industrial-scale deployments. By eliminating dependence on expensive proprietary hardware, this gateway offers MSMEs a practical, scalable, and immediately deployable foundation for real-time factory-floor visibility within Industry 4.0 environments.

References

[1] E. Sisinni, A. Saifullah, S. Han, U. Jennehag, and M. Gidlund, "Industrial Internet of Things: Challenges, Opportunities, and Directions," IEEE Transactions on Industrial Informatics, vol. 14, no. 11, pp. 4724–4734, 2018.

[2] R. Dharmawati, "Industrial Automation PLC, SCADA, IoT-based Monitoring, Smart Factories, and Cyber Physical Production Systems," Journal of Electrical Engineering, 2024.

[3] S. C. Lee, T. G. Jeon, H. S. Hwang, and C. S. Kim, "Design and Implementation of Wireless Sensor Based-Monitoring System for Smart Factory," International Conference on Computational Science, Springer, 2007.

[4] T. Begović, Z. Mandić, and N. Kukrić, "HTTP Embedded Web Server and its Application for Air Parameters Monitoring," International Journal of Electrical Engineering, 2023.

[5] V. C. Gungor, "Industrial Wireless Sensor," in Industrial Communication Systems, 2018.

[6] D. J. Russell, "Non-volatile Memory," in Introduction to Embedded Systems: Using ANSI C, Springer, 2022.

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Published

02-06-2026

Issue

Section

Articles

How to Cite

[1]
Devya and Shib Sankar Das 2026. Design and Implementation of a Low-Cost, High-Density IIoT Gateway for Smart Factory Monitoring Using ESP32. International Journal of Innovations in Science, Engineering And Management. 5, 2 (Jun. 2026), 364–375. DOI:https://doi.org/10.69968/ijisem.2026v5i2364-375.